October 16th - 20th, 2023
Laboratório de Microscopia Eletrônica de Alta Resolução / Centro de Caracterização Avançada Para Indústria de Petróleo — LaMAR/CAIPE. Location: Room T21 at the Physics Institute, UFF.
Theoretical course
Hands-On training of Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM) and Focused Ion Beam (FIB).
Courses:
Theoretical course: 40 slots
Hands-on Training: 18 slots
Divided into 6 slots for SEM, 6 slots for TEM training, and 6 slots for FIB training. No swapping of chosen slots during the school will be accepted.
Registrations open for Practical Courses in SEM, TEM, and FIB
The program will be defined soon.
Registrations can be made between the period from 15th August 2023 to 20th September 2023, through the form below.
There is no registration fee.
R$ 280.00
In this edition, it will be possible to provide financial assistance for participation in the practical course to a limited number of students from institutions in Brazil who are not from the state of Rio de Janeiro.
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Prof. Guillermo Solórzano - PUC-Rio
Prof. Fabio Barboza Passos - UFF
Profa. Andrea Latgé - UFF
Prof. Yutao Xing - UFF
Prof. Guillermo Solórzano - PUC-Rio
Dra. Cilene Labre - LNLS
Prof. Dante Franceschini - UFF
Prof. Geronimo Perez - UFF
Profª. Natasha Midori Suguihiro - UFRJ
Dra. Liying Liu - CBPF
Cauê de Souza Coutinho Nogueira - UFF
Leandro Reis Lidízio - UFF