7th HREM&N of UFF
Date of the School:
October 20th - 24th, 2025
Venue:
Laboratório de Microscopia Eletrônica de Alta Resolução / Centro de Caracterização Avançada Para Indústria de Petróleo — LaMAR/CAIPE. Location: Room T21 at the Physics Institute, UFF.
Objetive:
Theoretical course
Hands-On training of Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM) and Focused Ion Beam (FIB).
Topics:
- High-resolution electron microscopy
- Microanalyses
- Focused Ion Beam (FIB)
- Electron Backscatter Diffraction (EBSD)
Courses:
Theoretical course: 50 slots
Hands-on Training: 15 slots
*The Hands-on Training will be divided into 5 slots for SEM, 5 slots for TEM training, and 5 slots for FIB training. No swapping of chosen slots during the school will be accepted.
Program:
The program will be defined soon.
Prerequisites for Practical Training Applicants:
- Certificate of participation for a previously held theoretical course in Electron Microscopy.
- Letter of recommendation from the supervisor.
Registration:
Registrations can be made between the period from 12th August 2025 to 29th September 2025, through the form below.
Registration Fee:
Theoretical Course:
R$ 20.00
Practical Course:
To complete the registration, please fill out the form:
Scientific committee:
Prof. Guillermo Solórzano - PUC-Rio
Prof. Fabio Barboza Passos - UFF
Prof. Yutao Xing - UFF
Organizing Committee:
Prof. Yutao Xing - UFF
Prof. Guillermo Solórzano - PUC-Rio
Prof. Miguel Alexandre Novak - UFF
Dra. Cilene Labre - LNLS
Prof. Dante Franceschini - UFF
Prof. Geronimo Perez - UFF
Dra. Liying Liu - CBPF
Cauê de Souza Coutinho Nogueira - UFF
Victória de Almeida Garcia - UFF
Luciana Mary Neugedachter - UFF
Leandro Reis Lidízio - UFF
Adriele Aparecida de Almeida - UFF
Renan de Melo Correia Lima - UFF
Supporters:
